Discrete Semiconductor Failure Modes Failures of semiconductor devices in storage, or dormant applications, are the result of latent manufacturing defects that were not detected during device screening tests. For discrete semiconductors, such as transistors, a large percentage of failures are the result of die and wire bonding defects and contamination. A common failure mode of […]
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Semiconductor Failure Modes
Semiconductor Failure Modes : Discrete Semiconductor Failure Modes , Integrated Circuit Failure Modes , Hybrid Microcircuits and Failures , Memory IC Failure Modes , IC Packages and Failures, Lead Finish , Screening and Rescreening Tests , Electrostatic Discharge Effects
Discrete Semiconductor Failure Modes Failures of semiconductor devices in storage, or dormant applications, are the result of latent manufacturing defects that were not detected during device screening tests. For discrete semiconductors, such as transistors, a large percentage of failures are the result of die and wire bonding defects and contamination. A common failure mode of […]
Continue reading…
Semiconductor Failure Modes : Discrete Semiconductor Failure Modes , Integrated Circuit Failure Modes , Hybrid Microcircuits and Failures , Memory IC Failure Modes , IC Packages and Failures, Lead Finish , Screening and Rescreening Tests , Electrostatic Discharge Effects
Discrete Semiconductor Failure Modes Failures of semiconductor devices in storage, or dormant applications, are the result of latent manufacturing defects that were not detected during device screening tests. For discrete semiconductors, such as transistors, a large percentage of failures are the result of die and wire bonding defects and contamination. A common failure mode of […]
Continue reading…