Introduction The goal of the test process for integrated circuits is to separate good devices from bad devices, and to test good devices as good. Bad devices tested as bad become yield loss, but they also represent opportunity for cost reduction as we reduce number of defects in the process. When good devices are tested […]
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Testing of Integrated Circuits
Testing of Integrated Circuits:Introduction ,Defect Types ,Traditional Faults and Fault Models, Concepts of Test ,Types of Test , Test Methods , External Stored Response,Testing , BIST , Scan , IDDQ, Test Tradeoffs and Tradeoffs of Volume and Testability
Introduction The goal of the test process for integrated circuits is to separate good devices from bad devices, and to test good devices as good. Bad devices tested as bad become yield loss, but they also represent opportunity for cost reduction as we reduce number of defects in the process. When good devices are tested […]
Continue reading…
Testing of Integrated Circuits:Introduction ,Defect Types ,Traditional Faults and Fault Models, Concepts of Test ,Types of Test , Test Methods , External Stored Response,Testing , BIST , Scan , IDDQ, Test Tradeoffs and Tradeoffs of Volume and Testability
Introduction The goal of the test process for integrated circuits is to separate good devices from bad devices, and to test good devices as good. Bad devices tested as bad become yield loss, but they also represent opportunity for cost reduction as we reduce number of defects in the process. When good devices are tested […]
Continue reading…